The MXA is built for speed: it helps you shorten test times with capabilities such as rapid local measurements, display updates, and marker peak searches. Fast sweep speed optimizes your spurious measurements.
It’s also built for performance: you can accurately characterize device performance by measuring small signals in the presence of large ones with up to 116 dB (typical) third-order dynamic range. The best-in-class phase noise (–114 dBc/Hz at 10 kHz offset) enables you to achieve the lowest internal EVM floor for cellular communication standards like LTE. With deep capture memory, you can perform thorough signal characterization by capturing longer I/Q samples from signals-under-test.